Circuit-Based Characterization of Device Noise Using Phase Noise Data
نویسندگان
چکیده
منابع مشابه
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ژورنال
عنوان ژورنال: IEEE Transactions on Circuits and Systems I: Regular Papers
سال: 2010
ISSN: 1549-8328,1558-0806
DOI: 10.1109/tcsi.2009.2033535